good news! Teradyne Completes Delivery of 6000th J750 Semiconductor Test System
Today (6), Teradyne announced in North Reading, Massachusetts, USA that the J750 series semiconductor test machine has achieved the 6000th shipment. As one of the test manufacturers with the largest installed capacity of J750 test system, Ardentec welcomed Teradyne's 6000th J750 test system.
Regarding the collaboration, Chi-Ming Chang, Vice Chairman and President of Ardentec, said: "The J750 is a recognized solution in the MCU market." "The" zero-footprint "of the J750 allows us to maximize the use of test space to increase Capacity, and higher multi-site throughput can reduce test costs. This is a successful combination for any test environment, and we are happy to accept this shipment, which is important for Teradyne milestone."
Ty Akin, Teradyne ’s Vice President of Global Sales, said, “Terida is pleased to work with Ardentec to achieve this important milestone. Since 2004, Ardentec has used the Teradyne J750 test system to meet the changing needs of customers. With a wide range of instruments, the J750 can serve a wide range of market applications and various products including MCU automotive and IoT applications. Despite increasing product complexity and market pressure, Teradyne IG-XL software works in conjunction with the J750 platform Operations can still effectively reduce the workload of test engineering and help our customers achieve the best test economics as planned. "
It is reported that Teradyne J750 series provides the world's leading automotive and consumer application MCU product testing solutions, and is also a global leader in image sensor testing. The integration of low-cost products continues to grow and has extended to fingerprint sensors, MEMS, and Internet of Things (IoT) products with MCU wireless capabilities. The scalability of the J750 test system makes it an ideal choice for such products.
In addition, the Teradyne J750 series is an industry standard for test quality, effectively helping semiconductor manufacturers to pursue zero defect goals and multi-site throughput goals. The installed capacity of the J750 test system has now exceeded 6,000 units and has been widely used in more than 50 OSATs, which can support a complete mass production solution for wafer testing and final testing.
Regarding the collaboration, Chi-Ming Chang, Vice Chairman and President of Ardentec, said: "The J750 is a recognized solution in the MCU market." "The" zero-footprint "of the J750 allows us to maximize the use of test space to increase Capacity, and higher multi-site throughput can reduce test costs. This is a successful combination for any test environment, and we are happy to accept this shipment, which is important for Teradyne milestone."
Ty Akin, Teradyne ’s Vice President of Global Sales, said, “Terida is pleased to work with Ardentec to achieve this important milestone. Since 2004, Ardentec has used the Teradyne J750 test system to meet the changing needs of customers. With a wide range of instruments, the J750 can serve a wide range of market applications and various products including MCU automotive and IoT applications. Despite increasing product complexity and market pressure, Teradyne IG-XL software works in conjunction with the J750 platform Operations can still effectively reduce the workload of test engineering and help our customers achieve the best test economics as planned. "
It is reported that Teradyne J750 series provides the world's leading automotive and consumer application MCU product testing solutions, and is also a global leader in image sensor testing. The integration of low-cost products continues to grow and has extended to fingerprint sensors, MEMS, and Internet of Things (IoT) products with MCU wireless capabilities. The scalability of the J750 test system makes it an ideal choice for such products.
In addition, the Teradyne J750 series is an industry standard for test quality, effectively helping semiconductor manufacturers to pursue zero defect goals and multi-site throughput goals. The installed capacity of the J750 test system has now exceeded 6,000 units and has been widely used in more than 50 OSATs, which can support a complete mass production solution for wafer testing and final testing.